![用于材料研究的蔡司Axio Imager 2 用于材料研究的蔡司Axio Imager 2]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg"})
产品
用于材料研究的蔡司Axio Imager 2
用于自动材料分析的开放式显微镜系统
在您从事先进的材料研究时,Axio Imager 2可帮助简化光学显微镜工作流。蔡司Axio Imager 2能够对材料生成准确且可重复的结果。选择适合您应用的系统,使用颗粒分析等专用共聚焦或关联显微镜解决方案扩展您的设备。
![可重复的结果——享受无振动的工作环境 可重复的结果——享受无振动的工作环境]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.100.50.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.360.180.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.768.384.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.1024.512.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.1280.640.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.1440.720.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.1904.952.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg"})
可重复的结果
享受无振动的工作环境
如要获得准确的结果,稳定性必不可少。Axio Imager 2具有稳定的成像条件,而在使用高放大倍率或进行对时间有高要求的研究时,该特性更为显著。Axio Imager 2的电动化设计可以获得快速且可重复的结果,同时始终在恒定条件下工作。
![模块化设计——获得更大的灵活性 模块化设计——获得更大的灵活性]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.100.50.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.360.180.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.768.384.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.1024.512.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.1280.640.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.1440.720.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original./benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg"})
模块化设计
获得更大的灵活性
无论是学术还是工业研究,材料显微镜都面临着各种各样的挑战。借助Axio Imager 2,您将能够直面并战胜这些挑战。您可以连接特定于应用的组件,进行颗粒分析等工作,也可以检测非金属夹杂物(NMI)、液晶或基于半导体的MEM。借助专用共聚焦或关联显微镜解决方案,您的设备功能将得到扩展。
![高光学性能——实现出色衬度和分辨率 高光学性能——实现出色衬度和分辨率]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.100.50.file/axio-imager_nosepiece-turret_1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.360.180.file/axio-imager_nosepiece-turret_1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.768.384.file/axio-imager_nosepiece-turret_1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.1024.512.file/axio-imager_nosepiece-turret_1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.1280.640.file/axio-imager_nosepiece-turret_1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.1440.720.file/axio-imager_nosepiece-turret_1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original./axio-imager_nosepiece-turret_1.jpg"})
高光学性能
实现出色衬度和分辨率
- 使用不同观察方式观测金属、复合材料或液晶等一系列材料。
- 使用反射光,在明场、暗场、微分干涉相差(DIC)、圆微分干涉相差(C-DIC)、偏光或荧光下观察样品。
- 使用透射光,在明场、暗场、微分干涉相差(DIC)、偏光或圆偏光下检测样品。观察方式管理器能确保照明设置可复制。
![人体工程学:表面应用无极限 人体工程学:表面应用无极限]({"xsmall":"/adobe/dynamicmedia/deliver/dm-aid--d710db75-002c-486f-be2d-c2956b2c75f4/control-buttons-axio-imager-2.jpg?preferwebp=true&width=100&quality=85&crop=0,180,1920,1080","small":"/adobe/dynamicmedia/deliver/dm-aid--d710db75-002c-486f-be2d-c2956b2c75f4/control-buttons-axio-imager-2.jpg?preferwebp=true&width=360&quality=85&crop=0,180,1920,1080","medium":"/adobe/dynamicmedia/deliver/dm-aid--d710db75-002c-486f-be2d-c2956b2c75f4/control-buttons-axio-imager-2.jpg?preferwebp=true&width=768&quality=85&crop=0,180,1920,1080","large":"/adobe/dynamicmedia/deliver/dm-aid--d710db75-002c-486f-be2d-c2956b2c75f4/control-buttons-axio-imager-2.jpg?preferwebp=true&width=1024&quality=85&crop=0,180,1920,1080","xlarge":"/adobe/dynamicmedia/deliver/dm-aid--d710db75-002c-486f-be2d-c2956b2c75f4/control-buttons-axio-imager-2.jpg?preferwebp=true&width=1280&quality=85&crop=0,180,1920,1080","xxlarge":"/adobe/dynamicmedia/deliver/dm-aid--d710db75-002c-486f-be2d-c2956b2c75f4/control-buttons-axio-imager-2.jpg?preferwebp=true&width=1440&quality=85&crop=0,180,1920,1080","max":"/adobe/dynamicmedia/deliver/dm-aid--d710db75-002c-486f-be2d-c2956b2c75f4/control-buttons-axio-imager-2.jpg?preferwebp=true&width=1920&quality=85&crop=0,180,1920,1080"})
人体工程学设计
表面应用无极限
Axio Imager.Z2m或Axio Imager.M2m可在触摸屏上显示关键操作功能,手指轻松点击便可控制所有电动组件。其他控制按钮依照人体工程学设计排列在对焦驱动装置周边,带有触觉反馈的表面使其易于区分。Axio Imager.D2m有5个预编程按钮,Axio Imager.Z2m则有10个用户自定义按钮。Axio Imager.A2m已编码。
![热显微技术:灵活记录温度变化 热显微技术:灵活记录温度变化]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.100.75.0,0,457,343.file/linkam_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.360.270.0,0,457,343.file/linkam_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.457.343.0,0,457,343.file/linkam_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.457.343.0,0,457,343.file/linkam_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.457.343.0,0,457,343.file/linkam_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.457.343.0,0,457,343.file/linkam_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.457.343.0,0,457,343.file/linkam_stage.jpg"})
热显微技术
灵活记录温度变化
您是否想研究温度对金属、晶体、陶瓷或塑料的影响?
借助ZEN core和Linkam加热台,您可以定制加热或冷却实验。在时间序列中温度模式会得到记录,实验结果将包含每幅时间序列图像中的温度和真空数据。您可以在质量控制等应用领域中观察样品在加热和冷却过程中的变化。