![蔡司Crossbeam 550 Samplefab]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w_monitor-left.jpg/_jcr_content/renditions/original.image_file.100.100.file/crossbeam-550-samplefab_w_monitor-left.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w_monitor-left.jpg/_jcr_content/renditions/original.image_file.360.360.file/crossbeam-550-samplefab_w_monitor-left.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w_monitor-left.jpg/_jcr_content/renditions/original.image_file.768.768.file/crossbeam-550-samplefab_w_monitor-left.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w_monitor-left.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/crossbeam-550-samplefab_w_monitor-left.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w_monitor-left.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/crossbeam-550-samplefab_w_monitor-left.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w_monitor-left.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/crossbeam-550-samplefab_w_monitor-left.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w_monitor-left.jpg/_jcr_content/renditions/original./crossbeam-550-samplefab_w_monitor-left.jpg"} "蔡司Crossbeam 550 Samplefab")
产品
蔡司Crossbeam Samplefab
FIB-SEM简化自动化TEM薄片样品制备
蔡司Crossbeam 550 Samplefab是一款坚固耐用的预配置高端FIB-SEM，可在半导体实验室中实现无人值守的全自动TEM薄片样品制备。可靠的自动化流程助您获得优质样品和高薄片成功率，尤其适用于多区域制备。直观的用户界面专为快速学习而设计，在不牺牲灵活性的前提下实现了高效率。
简化TEM薄片样品制备
体验出色的自动化效率
![显示了蔡司Crossbeam 550的用户界面]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-samplefab_user-interface.jpg/_jcr_content/renditions/original.image_file.100.100.241,0,1679,1438.file/crossbeam-samplefab_user-interface.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-samplefab_user-interface.jpg/_jcr_content/renditions/original.image_file.360.360.241,0,1679,1438.file/crossbeam-samplefab_user-interface.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-samplefab_user-interface.jpg/_jcr_content/renditions/original.image_file.768.768.241,0,1679,1438.file/crossbeam-samplefab_user-interface.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-samplefab_user-interface.jpg/_jcr_content/renditions/original.image_file.1024.1024.241,0,1679,1438.file/crossbeam-samplefab_user-interface.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-samplefab_user-interface.jpg/_jcr_content/renditions/original.image_file.1280.1280.241,0,1679,1438.file/crossbeam-samplefab_user-interface.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-samplefab_user-interface.jpg/_jcr_content/renditions/original.image_file.1438.1438.241,0,1679,1438.file/crossbeam-samplefab_user-interface.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-samplefab_user-interface.jpg/_jcr_content/renditions/original.image_file.1438.1438.241,0,1679,1438.file/crossbeam-samplefab_user-interface.jpg"} "显示了蔡司Crossbeam 550的用户界面")
界面友好
操作简便
Crossbeam 550 Samplefab用户界面经过全新设计，便于新手和专家用户快速学习和直观操作，确保获得无缝衔接的体验。增强的控制软件提高了稳定性和可用性，进一步简化了操作流程。
自动化TEM薄片样品制备
优化结果
蔡司Crossbeam 550 Samplefab显微镜的免操作TEM薄片制备流程可在8小时内创建10个薄片，节省了宝贵的时间和资源。其专有的提取技术可提供出色的自动化效率，并能在各种类型的半导体样品上减薄至100 nm，确保始终获得高质量的结果。
![图表显示了最近100个薄片实验的统计数据]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/automation-yield-promise.jpg/_jcr_content/renditions/original.image_file.100.100.file/automation-yield-promise.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/automation-yield-promise.jpg/_jcr_content/renditions/original.image_file.360.360.file/automation-yield-promise.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/automation-yield-promise.jpg/_jcr_content/renditions/original./automation-yield-promise.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/automation-yield-promise.jpg/_jcr_content/renditions/original./automation-yield-promise.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/automation-yield-promise.jpg/_jcr_content/renditions/original./automation-yield-promise.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/automation-yield-promise.jpg/_jcr_content/renditions/original./automation-yield-promise.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/automation-yield-promise.jpg/_jcr_content/renditions/original./automation-yield-promise.jpg"} "图表显示了最近100个薄片实验的统计数据")
出色的自动化效率
实现高成功率
从大块样品到TEM载网，基于参数的自动化流程保证了无人值守的薄片处理可达到超过90%的自动化效率，无需操作人员干预。自动检查允许人工干预，以确保在处理过程中不会丢失薄片，从而使薄片成功率达到100%。
稳定高效的工作流
提高工作效率
Crossbeam Samplefab工作流非常强大，只需使用一个探针头就能创建数十个薄片，在大量使用多日后重塑探针头即可。这显著延长了工具用于生产的时间，减少了耗材开支，最终为您节省了时间和金钱。
为了满足业界对TEM薄片样品制备日益增长的需求，我们开发了Crossbeam 550 Samplefab这款专用的聚焦离子束扫描电子显微镜。我们的目标是提供强大的自动化功能，可在完全无人值守的情况下以高精度和高效率对低至100 nm的薄片进行处理。
![Thomas Rodgers博士头像]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/thomas-rodgers-headshot.jpg/_jcr_content/renditions/original.image_file.100.100.29,47,503,521.file/thomas-rodgers-headshot.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/thomas-rodgers-headshot.jpg/_jcr_content/renditions/original.image_file.360.360.29,47,503,521.file/thomas-rodgers-headshot.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/thomas-rodgers-headshot.jpg/_jcr_content/renditions/original.image_file.474.474.29,47,503,521.file/thomas-rodgers-headshot.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/thomas-rodgers-headshot.jpg/_jcr_content/renditions/original.image_file.474.474.29,47,503,521.file/thomas-rodgers-headshot.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/thomas-rodgers-headshot.jpg/_jcr_content/renditions/original.image_file.474.474.29,47,503,521.file/thomas-rodgers-headshot.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/thomas-rodgers-headshot.jpg/_jcr_content/renditions/original.image_file.474.474.29,47,503,521.file/thomas-rodgers-headshot.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/thomas-rodgers-headshot.jpg/_jcr_content/renditions/original.image_file.474.474.29,47,503,521.file/thomas-rodgers-headshot.jpg"} "蔡司显微镜电子元件业务部门负责人Thomas Rodgers博士")
下载
更多信息请参阅蔡司Crossbeam 550 Samplefab宣传册。
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/en_product-flyer_crossbeam_550_samplefab_cover.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/en_product-flyer_crossbeam_550_samplefab_cover.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/en_product-flyer_crossbeam_550_samplefab_cover.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/en_product-flyer_crossbeam_550_samplefab_cover.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/en_product-flyer_crossbeam_550_samplefab_cover.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/en_product-flyer_crossbeam_550_samplefab_cover.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/en_product-flyer_crossbeam_550_samplefab_cover.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/en_product-flyer_crossbeam_550_samplefab_cover.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/en_product-flyer_crossbeam_550_samplefab_cover.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/en_product-flyer_crossbeam_550_samplefab_cover.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/en_product-flyer_crossbeam_550_samplefab_cover.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/en_product-flyer_crossbeam_550_samplefab_cover.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/en_product-flyer_crossbeam_550_samplefab_cover.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/en_product-flyer_crossbeam_550_samplefab_cover.jpg"})
![蔡司Crossbeam——专为高效率三维分析和样品制备量身打造的FIB-SEM]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.100.100.file/crossbeam-550-system.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.360.360.file/crossbeam-550-system.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.768.768.file/crossbeam-550-system.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/crossbeam-550-system.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/crossbeam-550-system.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/crossbeam-550-system.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original./crossbeam-550-system.jpg"} "蔡司Crossbeam")