![蔡司MultiSEM：超高速扫描电子显微镜]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/multisem-stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/multisem-stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/multisem-stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/multisem-stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/multisem-stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/multisem-stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/multisem-stage.jpg"} "蔡司MultiSEM：超高速扫描电子显微镜")
蔡司MultiSEM
超高速扫描电子显微镜
充分运用多达91条并行电子束的采集速度，用纳米分辨率对厘米级样品进行成像。这款独特的扫描电子显微镜设计用于全天候连续、可靠的运行。只需简单设置高通量数据采集工作流，MultiSEM便能自动完成高衬度图像采集。
![小鼠大脑切片，最大采集速度为1.22千兆像素/秒。由美国马萨诸塞州剑桥市哈佛大学的J. Lichtman提供。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.100.50.file/multisem-benefit1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.360.180.file/multisem-benefit1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.768.384.file/multisem-benefit1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.1024.512.file/multisem-benefit1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.1280.640.file/multisem-benefit1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.1440.720.file/multisem-benefit1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original./multisem-benefit1.jpg"} "小鼠大脑切片")
革新电子显微镜速度
多条电子束并行，为您带来出色的总体成像速度，在4 nm像素大小下采集1 mm2的区域仅需几分钟。凭借每小时超过1 TB的出色采集速度，可在纳米级分辨率下对大体积物体（> 1 mm3）进行成像。 优化的探测器会高效收集二次电子信号，为您在低噪点水平下提供高衬度图像。
图片说明：小鼠大脑切片，最大采集速度为1.22千兆像素/秒。由美国马萨诸塞州剑桥市哈佛大学的J. Lichtman提供。
![以纳米级分辨率对大型样品进行成像]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.100.50.file/multisem-benefit2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.360.180.file/multisem-benefit2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.768.384.file/multisem-benefit2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.1024.512.file/multisem-benefit2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.1280.640.file/multisem-benefit2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.1440.720.file/multisem-benefit2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original./multisem-benefit2.jpg"} "以纳米级分辨率对大型样品进行成像")
以纳米级分辨率对大型样品进行成像
不必再为实现纳米级分辨率而牺牲样品尺寸。MultiSEM配备了一个覆盖10 cm × 10 cm区域的样品载具，并可全天候连续运行。现在，您可对整个样品进行成像，获取包含宏观信息的精细图像，探索您所需要的一切，探寻科学问题的答案。
![配备ZEN成像软件的电子显微镜]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.100.50.file/multisem-benefit3.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.360.180.file/multisem-benefit3.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.768.384.file/multisem-benefit3.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.1024.512.file/multisem-benefit3.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.1280.640.file/multisem-benefit3.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.1440.720.file/multisem-benefit3.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original./multisem-benefit3.jpg"} "配备ZEN成像软件的电子显微镜")
配备ZEN成像软件的电子显微镜
通过将ZEN引入MultiSEM，我们将蔡司光学显微镜的标准化软件带入了电子显微镜的世界。以一种简单直观的方式操控MultiSEM：智能自动调节程序助您捕获具有高分辨率和高质量的出色图像。您可以快速设置复杂的自动图像采集流程，将其用于您的样品成像。
蔡司MultiSEM
|
MultiSEM 506
|
|
|---|---|
|
电子束数量 |
91 |
|
扫描布局 |
图像拼接包含由91个以六边形模式排列的子图像 |
|
12 µm间距尺寸的观察视野 |
132 μm |
|
15 µm间距尺寸的观察视野（可选） |
165 μm |
蔡司MultiSEM背后的技术
![多条电子束和探测器并行]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.100.100.file/multisem-beampath.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.360.360.file/multisem-beampath.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.768.768.file/multisem-beampath.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.1024.1024.file/multisem-beampath.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.1280.1280.file/multisem-beampath.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.1440.1440.file/multisem-beampath.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original./multisem-beampath.png"} "多条电子束和探测器并行")
多条电子束和探测器并行
MultiSEM运用了多条电子束（绿色：照明通路）和探测器并行。微调探测通路（红色）能够收集大量的二次电子（SE）用于成像。电子束呈六边形排列，每条电子束在一个样品位置执行同步扫描程序，以此获得单个子图像，再通过合并所有图像拼接生成整幅图像。并行的计算机设置程序用于快速记录数据，以保证达到极高的整体成像速度。在MultiSEM系统中，图像采集和工作流程控制完全独立。
![自动切片]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.100.56.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.360.203.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.768.432.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.1024.576.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.1280.720.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.1440.810.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.1920.1080.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg"} "自动切片")
![样品镶嵌]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.100.56.file/multisem-wafer.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.360.203.file/multisem-wafer.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.768.432.file/multisem-wafer.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.1024.576.file/multisem-wafer.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.1280.720.file/multisem-wafer.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.1440.810.file/multisem-wafer.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original./multisem-wafer.jpg"} "样品镶嵌")
![实验设置]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.100.56.431,151,1215,593.file/multisem-software-screenshot.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.360.203.431,151,1215,593.file/multisem-software-screenshot.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.768.432.431,151,1215,593.file/multisem-software-screenshot.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.784.441.431,151,1215,593.file/multisem-software-screenshot.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.784.441.431,151,1215,593.file/multisem-software-screenshot.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.784.441.431,151,1215,593.file/multisem-software-screenshot.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.784.441.431,151,1215,593.file/multisem-software-screenshot.jpg"} "实验设置")
![股骨颈样品，选择性蚀刻出之前隐藏在骨基质中的骨细胞。样品由澳大利亚新南威尔士大学的M. Knothe Tate和美国俄亥俄州克利夫兰市的U. Knothe提供。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.100.75.80,0,1360,960.file/multisem-human-bone.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.360.270.80,0,1360,960.file/multisem-human-bone.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.768.576.80,0,1360,960.file/multisem-human-bone.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1024.768.80,0,1360,960.file/multisem-human-bone.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-human-bone.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-human-bone.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-human-bone.jpg"} "股骨颈样品")
![小鼠大脑切片，最大采集速度为1.22千兆像素/秒。由美国马萨诸塞州剑桥市哈佛大学的J. Lichtman提供。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.100.75.80,0,1360,960.file/multisem-mouse-brain.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.360.270.80,0,1360,960.file/multisem-mouse-brain.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.768.576.80,0,1360,960.file/multisem-mouse-brain.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.1024.768.80,0,1360,960.file/multisem-mouse-brain.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-mouse-brain.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-mouse-brain.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-mouse-brain.jpg"} "小鼠大脑切片")
![具有宽离子束切割表面的高成熟度页岩样品。样品由美国德克萨斯州休斯顿大学的L. Hathon提供。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.100.75.80,0,1360,960.file/multisem-shale-rock.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.360.270.80,0,1360,960.file/multisem-shale-rock.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.768.576.80,0,1360,960.file/multisem-shale-rock.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.1024.768.80,0,1360,960.file/multisem-shale-rock.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-shale-rock.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-shale-rock.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-shale-rock.jpg"} "高成熟度页岩样品")
![带有来自阳极一侧沉淀物的经多次充放电老化后的电池隔膜箔片。在1 KeV的低着陆能量下获得的图像，像素大小为4 nm，覆盖108 µm × 94 µm的观察视野。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.100.75.80,0,1360,960.file/multisem-battery.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.360.270.80,0,1360,960.file/multisem-battery.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.768.576.80,0,1360,960.file/multisem-battery.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.1024.768.80,0,1360,960.file/multisem-battery.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-battery.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-battery.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-battery.jpg"} "带有来自阳极一侧沉淀物的经多次充放电老化后的电池隔膜箔片。")
![65 nm节点技术的图形处理器集成电路，使用氢氟酸刻蚀到其硅基材。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.100.75.80,0,1360,960.file/multisem-processor.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.360.270.80,0,1360,960.file/multisem-processor.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.768.576.80,0,1360,960.file/multisem-processor.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.1024.768.80,0,1360,960.file/multisem-processor.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-processor.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-processor.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-processor.jpg"} "65 nm节点技术的图形处理器集成电路")
![股骨颈样品，选择性蚀刻出之前隐藏在骨基质中的骨细胞。样品由澳大利亚新南威尔士大学的M. Knothe Tate和美国俄亥俄州克利夫兰市的U. Knothe提供。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.100.67.file/multisem-human-bone.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.360.240.file/multisem-human-bone.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.768.512.file/multisem-human-bone.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1024.683.file/multisem-human-bone.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1280.853.file/multisem-human-bone.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original./multisem-human-bone.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original./multisem-human-bone.jpg"} "股骨颈样品")
![小鼠大脑切片，最大采集速度为1.22千兆像素/秒。由美国马萨诸塞州剑桥市哈佛大学的J. Lichtman提供。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1200,960.file/multisem-mouse-brain.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1200,960.file/multisem-mouse-brain.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1200,960.file/multisem-mouse-brain.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-mouse-brain.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-mouse-brain.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-mouse-brain.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-mouse-brain.jpg"} "小鼠大脑切片")
![具有宽离子束切割表面的高成熟度页岩样品。样品由美国德克萨斯州休斯顿大学的L. Hathon提供。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1200,960.file/multisem-shale-rock.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1200,960.file/multisem-shale-rock.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1200,960.file/multisem-shale-rock.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-shale-rock.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-shale-rock.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-shale-rock.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-shale-rock.jpg"} "高成熟度页岩样品")
![带有来自阳极一侧沉淀物的经多次充放电老化后的电池隔膜箔片。在1 KeV的低着陆能量下获得的图像，像素大小为4 nm，覆盖108 µm × 94 µm的观察视野。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1200,960.file/multisem-battery.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1200,960.file/multisem-battery.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1200,960.file/multisem-battery.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-battery.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-battery.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-battery.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-battery.jpg"} "带有来自阳极一侧沉淀物的经多次充放电老化后的电池隔膜箔片。")
![65 nm节点技术的图形处理器集成电路，使用氢氟酸刻蚀到其硅基材。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1200,960.file/multisem-processor.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1200,960.file/multisem-processor.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1200,960.file/multisem-processor.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-processor.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-processor.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-processor.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-processor.jpg"} "65 nm节点技术的图形处理器集成电路")
![蔡司MultiSEM的预览图像]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/c09181dc-02ed-4a15-9204-98e6c82672fd/CN_product-info_MultiSEM.pdf.jpg"} "下载蔡司MultiSEM")
![蔡司Crossbeam——专为高效率三维分析和样品制备量身打造的FIB-SEM]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.100.100.file/crossbeam-550-system.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.360.360.file/crossbeam-550-system.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.768.768.file/crossbeam-550-system.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/crossbeam-550-system.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/crossbeam-550-system.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/crossbeam-550-system.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original./crossbeam-550-system.jpg"} "蔡司Crossbeam")
![蔡司EVO——操作直观的模块化扫描电子显微镜平台，适用于日常检测与研究应用]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.100.100.file/evo_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.360.360.file/evo_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.768.768.file/evo_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/evo_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/evo_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/evo_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original./evo_stage.jpg"} "蔡司EVO")
![蔡司GeminiSEM系列]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.100.100.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.360.360.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.768.768.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.1280.1280.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.1353.1353.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.1353.1353.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg"} "蔡司GeminiSEM系列")
![蔡司Sigma]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/sigma360-stage.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/sigma360-stage.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/sigma360-stage.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/sigma360-stage.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png"} "蔡司Sigma")