![蔡司MultiSEM:超高速扫描电子显微镜 蔡司MultiSEM:超高速扫描电子显微镜]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/multisem-stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/multisem-stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/multisem-stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/multisem-stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/multisem-stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/multisem-stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/multisem-stage.jpg"})
蔡司MultiSEM 505/506
超高速扫描电子显微镜
充分运用多达91条并行电子束的采集速度,用纳米分辨率对厘米级样品进行成像。这款独特的扫描电子显微镜设计用于全天候连续、可靠的运行。只需简单设置高通量数据采集工作流,MultiSEM便能自动完成高衬度图像采集。
![小鼠大脑切片 小鼠大脑切片,最大采集速度为1.22千兆像素/秒。由美国马萨诸塞州剑桥市哈佛大学的J. Lichtman提供。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.100.50.file/multisem-benefit1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.360.180.file/multisem-benefit1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.768.384.file/multisem-benefit1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.1024.512.file/multisem-benefit1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.1280.640.file/multisem-benefit1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.1440.720.file/multisem-benefit1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original./multisem-benefit1.jpg"})
革新电子显微镜速度
多条电子束并行,为您带来出色的总体成像速度,在4 nm像素大小下采集1 mm2的区域仅需几分钟。凭借每小时超过1 TB的出色采集速度,可在纳米级分辨率下对大体积物体(> 1 mm3)进行成像。 优化的探测器会高效收集二次电子信号,为您在低噪点水平下提供高衬度图像。
图片说明:小鼠大脑切片,最大采集速度为1.22千兆像素/秒。由美国马萨诸塞州剑桥市哈佛大学的J. Lichtman提供。
![以纳米级分辨率对大型样品进行成像 以纳米级分辨率对大型样品进行成像]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.100.50.file/multisem-benefit2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.360.180.file/multisem-benefit2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.768.384.file/multisem-benefit2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.1024.512.file/multisem-benefit2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.1280.640.file/multisem-benefit2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.1440.720.file/multisem-benefit2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original./multisem-benefit2.jpg"})
以纳米级分辨率对大型样品进行成像
不必再为实现纳米级分辨率而牺牲样品尺寸。MultiSEM配备了一个覆盖10 cm × 10 cm区域的样品载具,并可全天候连续运行。现在,您可对整个样品进行成像,获取包含宏观信息的精细图像,探索您所需要的一切,探寻科学问题的答案。
![配备ZEN成像软件的电子显微镜 配备ZEN成像软件的电子显微镜]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.100.50.file/multisem-benefit3.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.360.180.file/multisem-benefit3.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.768.384.file/multisem-benefit3.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.1024.512.file/multisem-benefit3.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.1280.640.file/multisem-benefit3.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.1440.720.file/multisem-benefit3.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original./multisem-benefit3.jpg"})
配备ZEN成像软件的电子显微镜
通过将ZEN引入MultiSEM,我们将蔡司光学显微镜的标准化软件带入了电子显微镜的世界。以一种简单直观的方式操控MultiSEM:智能自动调节程序助您捕获具有高分辨率和高质量的出色图像。您可以快速设置复杂的自动图像采集流程,将其用于您的样品成像。
蔡司MultiSEM系列
MultiSEM 505
|
MultiSEM 506
|
|
---|---|---|
电子束数量 |
61 |
91 |
扫描布局 |
图像拼接包含由61个以六边形模式排列的子图像 |
图像拼接包含由91个以六边形模式排列的子图像 |
12 µm间距尺寸的观察视野 |
108 μm |
132 μm |
15 µm间距尺寸的观察视野(可选) |
135 μm |
165 μm |
蔡司MultiSEM背后的技术
![多条电子束和探测器并行 多条电子束和探测器并行]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.100.100.file/multisem-beampath.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.360.360.file/multisem-beampath.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.768.768.file/multisem-beampath.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.1024.1024.file/multisem-beampath.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.1280.1280.file/multisem-beampath.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.1440.1440.file/multisem-beampath.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original./multisem-beampath.png"})
![多条电子束和探测器并行 多条电子束和探测器并行]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.100.100.file/multisem-beampath.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.360.360.file/multisem-beampath.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.768.768.file/multisem-beampath.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.1024.1024.file/multisem-beampath.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.1280.1280.file/multisem-beampath.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.1440.1440.file/multisem-beampath.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original./multisem-beampath.png"})
多条电子束和探测器并行
MultiSEM运用了多条电子束(绿色:照明通路)和探测器并行。微调探测通路(红色)能够收集大量的二次电子(SE)用于成像。电子束呈六边形排列,每条电子束在一个样品位置执行同步扫描程序,以此获得单个子图像,再通过合并所有图像拼接生成整幅图像。并行的计算机设置程序用于快速记录数据,以保证达到极高的整体成像速度。在MultiSEM系统中,图像采集和工作流程控制完全独立。