![蔡司Sigma 蔡司Sigma]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/sigma360-stage.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/sigma360-stage.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/sigma360-stage.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/sigma360-stage.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png"})
蔡司Sigma 拥有高品质成像和高级显微分析功能的FE-SEM
蔡司Sigma系列产品集场发射扫描电子显微镜(FE-SEM)技术与良好的用户体验于一体,可轻松实现成像和分析程序,提高工作效率。 您可以将其用于新材料和颗粒的质量监测,或用于生物和地质样品的研究。在高分辨率成像方面精益求精——采用低电压,在1 kV或更低电压下获得更佳的分辨率和衬度。它出色的EDS几何学设计可执行高级显微分析,以两倍的速度和更高的精度获取分析数据。
使用Sigma系列,畅游高端纳米分析世界。
![对聚苯乙烯样品进行断裂,以了解聚合物界面处的裂纹形成和附着力。Sigma 360,C2D,3 kV,NanoVP lite模式,样品仓压力60Pa。 聚苯乙烯,使用NanoVP lite模式成像。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-benefit1.png/_jcr_content/renditions/original.image_file.100.50.file/sigma360-benefit1.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-benefit1.png/_jcr_content/renditions/original.image_file.360.180.file/sigma360-benefit1.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-benefit1.png/_jcr_content/renditions/original.image_file.768.384.file/sigma360-benefit1.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-benefit1.png/_jcr_content/renditions/original.image_file.1024.512.file/sigma360-benefit1.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-benefit1.png/_jcr_content/renditions/original.image_file.1280.640.file/sigma360-benefit1.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-benefit1.png/_jcr_content/renditions/original.image_file.1440.720.file/sigma360-benefit1.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-benefit1.png/_jcr_content/renditions/original./sigma360-benefit1.png"})
Sigma 360
分析测试平台的理想之选,直观的图像采集
- 从设置到获取基于人工智能的结果,均提供专业向导,为您保驾护航,助您探索直观的成像工作流。
- 可在1 kV和更低电压下分辨差异,实现更高的分辨率和优化的衬度。
- 可在极端条件下执行可变压力成像,获得出色的非导体成像结果。
图片说明:聚苯乙烯,使用NanoVP lite模式成像。
![500 V下的高分辨率:这个由氧化铝(Al2O3)烧结的纳米级球体的梯度测量尺寸为3 nm。使用Sigma 560、Inlens SE探测器在500 V下成像。 500 V下的高分辨率:这个由氧化铝(Al2O3)烧结的纳米级球体的梯度测量尺寸为3 nm。使用Sigma 560、Inlens SE探测器在500 V下成像。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-benefit2.png/_jcr_content/renditions/original.image_file.100.50.file/sigma360-benefit2.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-benefit2.png/_jcr_content/renditions/original.image_file.360.180.file/sigma360-benefit2.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-benefit2.png/_jcr_content/renditions/original.image_file.768.384.file/sigma360-benefit2.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-benefit2.png/_jcr_content/renditions/original.image_file.1024.512.file/sigma360-benefit2.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-benefit2.png/_jcr_content/renditions/original.image_file.1280.640.file/sigma360-benefit2.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-benefit2.png/_jcr_content/renditions/original.image_file.1440.720.file/sigma360-benefit2.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-benefit2.png/_jcr_content/renditions/original./sigma360-benefit2.png"})
Sigma 560
高通量分析,原位实验自动化
- 对实体样品进行高效分析:基于SEM的高速和全方位分析。
- 实现原位实验自动化:无人值守测试的全集成实验室。
- 可在低于1 kV的条件下完成要求严苛的样品成像:采集完整的样品信息。
技术
![Gemini光学镜筒截面示意图 Gemini光学镜筒截面示意图,包含电子束推进器、Inlens探测器和Gemini物镜。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.100.100.file/sigma_objective_lens.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.360.360.file/sigma_objective_lens.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.768.768.file/sigma_objective_lens.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/sigma_objective_lens.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/sigma_objective_lens.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/sigma_objective_lens.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original./sigma_objective_lens.jpg"})
![Gemini光学镜筒截面示意图 Gemini光学镜筒截面示意图,包含电子束推进器、Inlens探测器和Gemini物镜。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.100.100.file/sigma_objective_lens.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.360.360.file/sigma_objective_lens.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.768.768.file/sigma_objective_lens.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/sigma_objective_lens.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/sigma_objective_lens.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/sigma_objective_lens.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original./sigma_objective_lens.jpg"})
Gemini光学镜筒截面示意图,包含电子束推进器、Inlens探测器和Gemini物镜。
Gemini 1的光学系统
Gemini 1的光学系统由三个元件组成:物镜、电子束推进器和具有Inlens探测原理的探测器。其中,物镜的设计将静电场与磁场的作用力相结合,大大优化光学性能的同时,降低了样品所处的场影响。如此也可实现对磁性材料等具有挑战性的样品的高品质成像。Inlens探测原理通过对二次电子(SE)和/或背散射电子(BSE)的探测来确保高效的信号检测,同时大幅缩短获取图像的时间。电子束推进器保证了小尺寸的电子束斑和高信噪比。
![Gemini 1光学镜筒与探测器截面示意图。 Sigma的Gemini 1光学镜筒与探测器。1 Inlens探测器,SE或Duo。2 ETSE探测器、3 VPSE、4 C2D、5 aSTEM、6/7 高级EDS探测和不同的背散射探测器,如aBSD1。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.100.100.file/gemini_optical_column_with_detectors.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.360.360.file/gemini_optical_column_with_detectors.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.768.768.file/gemini_optical_column_with_detectors.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/gemini_optical_column_with_detectors.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/gemini_optical_column_with_detectors.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/gemini_optical_column_with_detectors.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original./gemini_optical_column_with_detectors.jpg"})
Gemini 1光学镜筒与探测器截面示意图。
![Gemini 1光学镜筒与探测器截面示意图 Sigma的Gemini 1光学镜筒与探测器。1 Inlens探测器,SE或Duo。2 ETSE探测器、3 VPSE、4 C2D、5 aSTEM、6/7 高级EDS探测和不同的背散射探测器,如aBSD1。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.100.100.file/gemini_optical_column_with_detectors.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.360.360.file/gemini_optical_column_with_detectors.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.768.768.file/gemini_optical_column_with_detectors.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/gemini_optical_column_with_detectors.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/gemini_optical_column_with_detectors.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/gemini_optical_column_with_detectors.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original./gemini_optical_column_with_detectors.jpg"})
Sigma的Gemini 1光学镜筒与探测器。1 Inlens探测器,SE或Duo。2 ETSE探测器、3 VPSE、4 C2D、5 aSTEM、6/7 高级EDS探测和不同的背散射探测器,如aBSD1。
灵活探测
Sigma配备了一系列不同的探测器,通过新探测技术对您的样品进行表征。使用ETSE和Inlens探测器的高真空模式可获取表面形貌的高分辨率信息。使用VPSE或C2D探测器的可变压力模式可获得清晰图像。使用aSTEM探测器可进行高分辨率透射电子成像。 采用不同的可选BSE探测器(如aBSD探测器)可以深入研究样品的成分和表面形貌。
NanoVP lite模式
- 在NanoVP lite模式下,裙边效应降低且入射束流的路径长度(BGPL)减小。裙边减小会提高SE和BSE成像的信噪比。
- 带有五段圆弧的伸缩式aBSD可提供出色的材料成分衬度:在NanoVP lite工作过程中,该探测器配备了安装在极靴下方的束流套管,其可提供高通量及低电压的成分和表面形貌高衬度成像,适用于可变压力和高真空条件。
配件
![蔡司FE-SEM原位实验室 蔡司FE-SEM原位实验室——连接材料性能与微观结构的桥梁]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/geminisem460-monitore-insitu.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1680,1440.file/geminisem460-monitore-insitu.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/geminisem460-monitore-insitu.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1680,1440.file/geminisem460-monitore-insitu.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/geminisem460-monitore-insitu.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1680,1440.file/geminisem460-monitore-insitu.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/geminisem460-monitore-insitu.jpg/_jcr_content/renditions/original.image_file.1024.1024.240,0,1680,1440.file/geminisem460-monitore-insitu.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/geminisem460-monitore-insitu.jpg/_jcr_content/renditions/original.image_file.1280.1280.240,0,1680,1440.file/geminisem460-monitore-insitu.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/geminisem460-monitore-insitu.jpg/_jcr_content/renditions/original.image_file.1440.1440.240,0,1680,1440.file/geminisem460-monitore-insitu.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/geminisem460-monitore-insitu.jpg/_jcr_content/renditions/original.image_file.1440.1440.240,0,1680,1440.file/geminisem460-monitore-insitu.jpg"})
蔡司FE-SEM原位实验室
连接材料性能与微观结构的桥梁
在进行加热和拉伸实验时,可通过使用原位解决方案来拓展蔡司FE-SEM,尽享集成解决方案的优势。对金属、合金、聚合物、塑料、复合材料以及陶瓷等材料进行深入研究。将力学拉伸或压缩载物台、加热单元和专用高温探测器与分析相结合。所有系统组件均可通过安装于个人电脑上的统一软件控制,从而实现无人值守的自动化材料测试。
![SmartEDX SmartEDX——探索嵌入式能量色散X射线谱]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/accessories/smart-edx_system.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1680,1440.file/smart-edx_system.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/accessories/smart-edx_system.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1680,1440.file/smart-edx_system.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/accessories/smart-edx_system.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1680,1440.file/smart-edx_system.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/accessories/smart-edx_system.jpg/_jcr_content/renditions/original.image_file.1024.1024.240,0,1680,1440.file/smart-edx_system.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/accessories/smart-edx_system.jpg/_jcr_content/renditions/original.image_file.1280.1280.240,0,1680,1440.file/smart-edx_system.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/accessories/smart-edx_system.jpg/_jcr_content/renditions/original.image_file.1440.1440.240,0,1680,1440.file/smart-edx_system.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/accessories/smart-edx_system.jpg/_jcr_content/renditions/original.image_file.1440.1440.240,0,1680,1440.file/smart-edx_system.jpg"})
SmartEDX
探索嵌入式能量色散X射线谱
![完全集成的RISE 完全集成的RISE——充分发挥拉曼成像和扫描电镜的性能优势]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/accessories/sigma-300-rise-system.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1680,1440.file/sigma-300-rise-system.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/accessories/sigma-300-rise-system.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1680,1440.file/sigma-300-rise-system.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/accessories/sigma-300-rise-system.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1680,1440.file/sigma-300-rise-system.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/accessories/sigma-300-rise-system.jpg/_jcr_content/renditions/original.image_file.1024.1024.240,0,1680,1440.file/sigma-300-rise-system.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/accessories/sigma-300-rise-system.jpg/_jcr_content/renditions/original.image_file.1280.1280.240,0,1680,1440.file/sigma-300-rise-system.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/accessories/sigma-300-rise-system.jpg/_jcr_content/renditions/original.image_file.1440.1440.240,0,1680,1440.file/sigma-300-rise-system.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/accessories/sigma-300-rise-system.jpg/_jcr_content/renditions/original.image_file.1440.1440.240,0,1680,1440.file/sigma-300-rise-system.jpg"})
完全集成的RISE
充分发挥拉曼成像和扫描电镜的性能优势
补充材料表征,并增加拉曼光谱成像。使用共聚焦拉曼成像功能,获取样品的化学指纹图并扩展您的Sigma 300。此外,它还可辨别分子和晶体信息,执行三维分析,将SEM成像与拉曼光谱成像和EDS数据相关联(如适用)。完全集成的RISE可充分发挥SEM和拉曼系统的全部优势。