![蔡司SmartPI——Smart Particle Investigator 蔡司SmartPI——Smart Particle Investigator]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.100.33.file/nanoscale-correlative-analysis_wallpaper.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.360.120.file/nanoscale-correlative-analysis_wallpaper.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.768.256.file/nanoscale-correlative-analysis_wallpaper.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.1024.341.file/nanoscale-correlative-analysis_wallpaper.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.1280.427.file/nanoscale-correlative-analysis_wallpaper.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.1440.480.file/nanoscale-correlative-analysis_wallpaper.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original./nanoscale-correlative-analysis_wallpaper.jpg"})
软件
纳米级和关联分析
按照您的要求量身定制的颗粒度分析解决方案
蔡司系统能够分析滤光片上的颗粒,并让您获得更多关于材料化学组分的信息。使用电子显微镜和SmartPI软件全自动分析多达200,000个颗粒。Correlative Particle Analyzer(关联颗粒度分析系统)是将光学与电子显微镜的分析数据相结合的出色解决方案,且符合ISO 16232和VDA19标准。
SmartPI
![SmartPI:自动颗粒度分析 SmartPI:自动颗粒度分析]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.100.100.48,116,1315,1383.file/evo_system_1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.360.360.48,116,1315,1383.file/evo_system_1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.768.768.48,116,1315,1383.file/evo_system_1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.1024.1024.48,116,1315,1383.file/evo_system_1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.1267.1267.48,116,1315,1383.file/evo_system_1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.1267.1267.48,116,1315,1383.file/evo_system_1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.1267.1267.48,116,1315,1383.file/evo_system_1.jpg"})
SmartPI:自动颗粒度分析
SmartPI是自动颗粒度分析的利器,适用于纳米级颗粒尺寸,其中包括化学组分的EDS分析。即便颗粒位于边界处,也同样能正确计数。您可以在同一用户界面下操作EDS和SEM。另外可使用各种评估方法,如离线分析和在测量或统计数据中排除颗粒,从而正确设定分析等级并创建一份专业、全面的报告。升级您的系统,使其具备关联颗粒度分析(CAPA)性能。
用于自动纳米级颗粒度分析的SmartPI包括:
- 一台电子显微镜,如EVO、SIGMA、MERLIN、ParticleSCAN、JetSCAN
- SmartPI软件
CAPA
![Correlative Particle Analyzer Correlative Particle Analyzer]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.100.56.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.360.203.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.768.432.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.1024.576.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.1280.720.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.1440.810.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.1639.922.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg"})
Correlative Particle Analyzer
快速颗粒度分析
- 选择高分辨率的蔡司显微镜系统进行颗粒度化学分析。
- 获得结果的速度提高了10倍。
- 首先,根据颗粒大小对反射(如金属颗粒)和非反射颗粒进行分类,并在光学显微镜下辨识纤维。
- 然后,将颗粒转移至电子显微镜下进行全自动EDS分析。
- 最后,在单份报告中结合显示光学显微镜和电子显微镜的分析结果。
- 符合ISO 16232和VDA19颗粒度分析标准。
![Correlative Particle Analyzer Correlative Particle Analyzer]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.100.75.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.360.270.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.768.576.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1024.768.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1280.960.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1440.1080.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1820.1365.114,0,1934,1365.file/corrmic_particle-analyzer.jpg"})
用于颗粒度分析的Correlative Particle Analyzer包括:
- EVO MA 10电子显微镜
- Axio Zoom.V16全电动变倍显微镜
- 关联样品载具
- AxioVision Correlative Particle Analyzer软件