![蔡司SmartPI——Smart Particle Investigator 蔡司SmartPI——Smart Particle Investigator]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-stage_wallpaper.jpg/_jcr_content/renditions/original.image_file.100.33.file/smart-pi-stage_wallpaper.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-stage_wallpaper.jpg/_jcr_content/renditions/original.image_file.360.120.file/smart-pi-stage_wallpaper.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-stage_wallpaper.jpg/_jcr_content/renditions/original.image_file.768.256.file/smart-pi-stage_wallpaper.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-stage_wallpaper.jpg/_jcr_content/renditions/original.image_file.1024.341.file/smart-pi-stage_wallpaper.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-stage_wallpaper.jpg/_jcr_content/renditions/original.image_file.1280.427.file/smart-pi-stage_wallpaper.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-stage_wallpaper.jpg/_jcr_content/renditions/original.image_file.1440.480.file/smart-pi-stage_wallpaper.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-stage_wallpaper.jpg/_jcr_content/renditions/original./smart-pi-stage_wallpaper.jpg"})
软件
蔡司SmartPI
Smart Particle Investigator
![颗粒分类的能量色散X射线谱(EDS) 颗粒分类的能量色散X射线谱(EDS)]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.100.100.161,0,576,415.file/eds-particle-classification.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.360.360.161,0,576,415.file/eds-particle-classification.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.415.415.161,0,576,415.file/eds-particle-classification.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.415.415.161,0,576,415.file/eds-particle-classification.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.415.415.161,0,576,415.file/eds-particle-classification.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.415.415.161,0,576,415.file/eds-particle-classification.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.415.415.161,0,576,415.file/eds-particle-classification.jpg"})
![颗粒分类的能量色散X射线谱(EDS) 颗粒分类的能量色散X射线谱(EDS)]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.100.56.file/eds-particle-classification.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.360.203.file/eds-particle-classification.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original./eds-particle-classification.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original./eds-particle-classification.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original./eds-particle-classification.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original./eds-particle-classification.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original./eds-particle-classification.jpg"})
颗粒分类的能量色散X射线谱(EDS)
自动SEM颗粒分析和分类的解决方案
颗粒检测、分析和分类
Smart Particle Investigator(SmartPI)是先进的颗粒分析和分类解决方案,它将扫描电子显微镜转化为用于工业清洁或金属与钢应用的完整解决方案。SmartPI将SEM控制、图像处理和元素分析(EDS)的各个方面整合到了一个应用程序中。
- 使用一个软件程序控制SEM成像和进行EDS分析。
- 执行无人值守的自动颗粒分析。
- 生成可重复性数据和符合工业标准的报告。
- 将SmartPI与蔡司光学显微镜颗粒分析解决方案相结合,以配置关联工作流。
- 蔡司对整个系统的全球性服务和支持为您带来放心体验。
- SmartPI符合清洁度标准ISO 16232和VDA 19的要求。
SmartPI应用案例
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-workflow-wallpaper.jpg/_jcr_content/renditions/original.image_file.100.25.0,1,1700,426.file/smart-pi-workflow-wallpaper.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-workflow-wallpaper.jpg/_jcr_content/renditions/original.image_file.360.90.0,1,1700,426.file/smart-pi-workflow-wallpaper.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-workflow-wallpaper.jpg/_jcr_content/renditions/original.image_file.768.192.0,1,1700,426.file/smart-pi-workflow-wallpaper.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-workflow-wallpaper.jpg/_jcr_content/renditions/original.image_file.1024.256.0,1,1700,426.file/smart-pi-workflow-wallpaper.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-workflow-wallpaper.jpg/_jcr_content/renditions/original.image_file.1280.320.0,1,1700,426.file/smart-pi-workflow-wallpaper.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-workflow-wallpaper.jpg/_jcr_content/renditions/original.image_file.1440.360.0,1,1700,426.file/smart-pi-workflow-wallpaper.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-workflow-wallpaper.jpg/_jcr_content/renditions/original.image_file.1700.425.0,1,1700,426.file/smart-pi-workflow-wallpaper.jpg"})
推荐的SEM平台
![EVO扫描电子显微镜 EVO扫描电子显微镜]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/evo_product.jpg/_jcr_content/renditions/original.image_file.100.100.file/evo_product.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/evo_product.jpg/_jcr_content/renditions/original.image_file.360.360.file/evo_product.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/evo_product.jpg/_jcr_content/renditions/original.image_file.768.768.file/evo_product.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/evo_product.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/evo_product.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/evo_product.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/evo_product.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/evo_product.jpg/_jcr_content/renditions/original./evo_product.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/evo_product.jpg/_jcr_content/renditions/original./evo_product.jpg"})
EVO扫描电子显微镜
EVO是一款常规SEM,普遍用于常规材料分析或工业质量保证和失效分析。EVO配备大型五轴电动载物台以及简单易用的SmartSEM软件,为颗粒分析应用提供了可灵活配置的成像平台。EVO提供可变压力模式(VP),可进行不导电样品(如滤膜)的成像和分析,而无需导电喷镀,这将确保在后续分析(如Raman或FTIR)时滤膜的完好性。
![Sigma场发射扫描电子显微镜 Sigma场发射扫描电子显微镜]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/zeiss-sigma-500-small.jpg/_jcr_content/renditions/original.image_file.100.100.84,99,849,864.file/zeiss-sigma-500-small.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/zeiss-sigma-500-small.jpg/_jcr_content/renditions/original.image_file.360.360.84,99,849,864.file/zeiss-sigma-500-small.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/zeiss-sigma-500-small.jpg/_jcr_content/renditions/original.image_file.765.765.84,99,849,864.file/zeiss-sigma-500-small.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/zeiss-sigma-500-small.jpg/_jcr_content/renditions/original.image_file.765.765.84,99,849,864.file/zeiss-sigma-500-small.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/zeiss-sigma-500-small.jpg/_jcr_content/renditions/original.image_file.765.765.84,99,849,864.file/zeiss-sigma-500-small.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/zeiss-sigma-500-small.jpg/_jcr_content/renditions/original.image_file.765.765.84,99,849,864.file/zeiss-sigma-500-small.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/zeiss-sigma-500-small.jpg/_jcr_content/renditions/original.image_file.765.765.84,99,849,864.file/zeiss-sigma-500-small.jpg"})
Sigma场发射扫描电子显微镜
Sigma是需要更高分辨率来进行纳米级颗粒度分析的用户的理想SEM。配备Gemini镜筒技术的Sigma可以从场发射扫描电子显微镜(FE-SEM)获得出色的成像能力和精准的分析结果。Gemini光学系统可在一个非常适合元素分析(尤其是对磁性样品)的平台上提供高分辨率成像。