![蔡司Xradia Ultra 蔡司Xradia Ultra]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.100.100.279,243,1680,1644.file/xradia-810-ultra_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.360.360.279,243,1680,1644.file/xradia-810-ultra_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.768.768.279,243,1680,1644.file/xradia-810-ultra_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.279,243,1680,1644.file/xradia-810-ultra_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.1280.1280.279,243,1680,1644.file/xradia-810-ultra_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.1401.1401.279,243,1680,1644.file/xradia-810-ultra_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.1401.1401.279,243,1680,1644.file/xradia-810-ultra_stage.jpg"})
蔡司Xradia Ultra
纳米级X射线成像:开启科学探索之门
同步辐射X射线纳米CT能够实现纳米级的无损三维成像,但您只能申请非常有限的线站机时。想象一下,如果不用等待同步辐射的时间,而且可以在自己的实验室里实现同步辐射实验,是多么理想的状态。有了蔡司Xradia Ultra系列产品,就意味着您拥有了一台可以提供同步辐射纳米级图像分辨率的高质量三维无损X射线显微镜(XRM)。该系列有蔡司Xradia 810 Ultra和蔡司Xradia 800 Ultra两种型号供您选择,它们均为您在最常用的应用中获得出色图像质量而量身定制。
![使用无损纳米级成像为您的研究助力 Xradia Ultra 810内部]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/untra_benefit1.jpg/_jcr_content/renditions/original.image_file.100.50.file/untra_benefit1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/untra_benefit1.jpg/_jcr_content/renditions/original.image_file.360.180.file/untra_benefit1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/untra_benefit1.jpg/_jcr_content/renditions/original.image_file.768.384.file/untra_benefit1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/untra_benefit1.jpg/_jcr_content/renditions/original.image_file.1024.512.file/untra_benefit1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/untra_benefit1.jpg/_jcr_content/renditions/original.image_file.1280.640.file/untra_benefit1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/untra_benefit1.jpg/_jcr_content/renditions/original.image_file.1440.720.file/untra_benefit1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/untra_benefit1.jpg/_jcr_content/renditions/original./untra_benefit1.jpg"})
使用无损纳米级成像为您的研究助力
- 利用极为出色的无损成像,在原生环境下以三维方式观察纳米级现象。
- 这是一款填补亚微米级图像分辨率XRM(如蔡司Xradia Versa)和分辨率更高但具有破坏性的三维成像系统(如FIB-SEM)之间空白的设备。
- 使用集成的原位解决方案,在您的实验室就能进行图像分辨率高达50 nm、体素尺寸低至16 nm的先进的无损三维/四维X射线成像。
- 将这些特殊的功能添加到您的分析产品组合中,以加速您的研究。
实现出色的衬度和图像质量
- 在不破坏您样品的情况下,切片不会受伪影影响,以三维方式观察缺陷。
- 利用吸收和Zernike相位衬度,以出色的衬度和图像质量显示细节。将两种模式的数据相结合,能够显示出单一衬度无法实现的特征。
- Xradia 810 Ultra和Xradia 800 Ultra旨在为您常用的应用提供出色的图像质量。您可以根据研究材料所需要的优化衬度、通量和材料透过率来选择适合您的版本。
- 使用Xradia Ultra,可获得具有同步辐射效果的纳米级X射线成像。
图片说明:Zernike相位衬度(ZPC)模式(左)和吸收衬度(右)下的松针的二维重构切片。
![拓展您实验室的界限 在进行原位压缩实验前用Zernike相位衬度成像的三维打印纳米晶格结构。样品提供者:德国卡尔斯鲁厄理工学院的R. Schweiger(样品宽度30 µm)。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/untra_benefit2.jpg/_jcr_content/renditions/original.image_file.100.50.file/untra_benefit2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/untra_benefit2.jpg/_jcr_content/renditions/original.image_file.360.180.file/untra_benefit2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/untra_benefit2.jpg/_jcr_content/renditions/original.image_file.768.384.file/untra_benefit2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/untra_benefit2.jpg/_jcr_content/renditions/original.image_file.1024.512.file/untra_benefit2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/untra_benefit2.jpg/_jcr_content/renditions/original.image_file.1280.640.file/untra_benefit2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/untra_benefit2.jpg/_jcr_content/renditions/original.image_file.1440.720.file/untra_benefit2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/untra_benefit2.jpg/_jcr_content/renditions/original./untra_benefit2.jpg"})
拓展您实验室的界限
- 同步辐射品质的成像效果让您的研究水平更上一层楼。消除同步辐射装置上的准入障碍,在自己的实验室中就能按计划获得同等的纳米级三维成像效果。
- 进行以往在基于实验室的成像中不可能实现的四维和原位研究。
- 另外,还可以进行原位力学、热学、电化学和环境测试。
- 使用关联工作流并连接到其他成像分析方法(如蔡司Xradia Versa、蔡司Crossbeam、分析)。通过包括专用的Python API在内的简洁用户界面,为广大成像装置用户提供服务。
图片说明:在进行原位压缩实验前用Zernike相位衬度成像的三维打印纳米晶格结构。样品提供者:德国卡尔斯鲁厄理工学院的R. Schweiger(样品宽度30 µm)。
![蔡司Xradia Ultra X射线显微镜的光路图。 蔡司Xradia Ultra X射线显微镜的光路图。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-ultra-beampath.jpg/_jcr_content/renditions/original.image_file.100.25.0,240,1920,720.file/xradia-ultra-beampath.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-ultra-beampath.jpg/_jcr_content/renditions/original.image_file.360.90.0,240,1920,720.file/xradia-ultra-beampath.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-ultra-beampath.jpg/_jcr_content/renditions/original.image_file.768.192.0,240,1920,720.file/xradia-ultra-beampath.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-ultra-beampath.jpg/_jcr_content/renditions/original.image_file.1024.256.0,240,1920,720.file/xradia-ultra-beampath.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-ultra-beampath.jpg/_jcr_content/renditions/original.image_file.1280.320.0,240,1920,720.file/xradia-ultra-beampath.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-ultra-beampath.jpg/_jcr_content/renditions/original.image_file.1440.360.0,240,1920,720.file/xradia-ultra-beampath.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-ultra-beampath.jpg/_jcr_content/renditions/original.image_file.1920.480.0,240,1920,720.file/xradia-ultra-beampath.jpg"})
![蔡司Xradia Ultra X射线显微镜的光路图。 蔡司Xradia Ultra X射线显微镜的光路图。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-ultra-beampath.jpg/_jcr_content/renditions/original.image_file.100.50.file/xradia-ultra-beampath.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-ultra-beampath.jpg/_jcr_content/renditions/original.image_file.360.180.file/xradia-ultra-beampath.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-ultra-beampath.jpg/_jcr_content/renditions/original.image_file.768.384.file/xradia-ultra-beampath.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-ultra-beampath.jpg/_jcr_content/renditions/original.image_file.1024.512.file/xradia-ultra-beampath.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-ultra-beampath.jpg/_jcr_content/renditions/original.image_file.1280.640.file/xradia-ultra-beampath.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-ultra-beampath.jpg/_jcr_content/renditions/original.image_file.1440.720.file/xradia-ultra-beampath.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-ultra-beampath.jpg/_jcr_content/renditions/original./xradia-ultra-beampath.jpg"})
蔡司Xradia Ultra X射线显微镜的光路图。
蔡司Xradia Ultra X射线显微镜的光路图。
通过使用以下元件,尽享来源于同步辐射的架构的优势:
- 反射毛细管聚光镜,可在最大通量密度下匹配光源特性和图像
- 带菲涅尔波带片等的物镜,获得专利 (US 8526575 B1 和 US 9640291 B2) 的纳米加工技术为您的研究提供出色的图像分辨率和聚焦效率的光学元件
- 用于Zernike相位衬度的相位环,可显示低吸收样品的细节
- 基于闪烁体的高衬度、高效探测器,与CCD探测器光学耦合,在有限的实验时间内为您提供优良的信号
- 随着样品的旋转,可以收集到各种投影角度的图像并将其重构为三维断层扫描数据集
![应用 应用]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/applications/applications_ultra-800.jpg/_jcr_content/renditions/original.image_file.100.50.146,74,1921,961.file/applications_ultra-800.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/applications/applications_ultra-800.jpg/_jcr_content/renditions/original.image_file.360.180.146,74,1921,961.file/applications_ultra-800.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/applications/applications_ultra-800.jpg/_jcr_content/renditions/original.image_file.768.384.146,74,1921,961.file/applications_ultra-800.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/applications/applications_ultra-800.jpg/_jcr_content/renditions/original.image_file.1024.512.146,74,1921,961.file/applications_ultra-800.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/applications/applications_ultra-800.jpg/_jcr_content/renditions/original.image_file.1280.640.146,74,1921,961.file/applications_ultra-800.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/applications/applications_ultra-800.jpg/_jcr_content/renditions/original.image_file.1440.720.146,74,1921,961.file/applications_ultra-800.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/applications/applications_ultra-800.jpg/_jcr_content/renditions/original.image_file.1774.887.146,74,1921,961.file/applications_ultra-800.jpg"})
应用
了解如何对材料、生命或地球科学等不同研究领域的样品成像。
配件
![纳米级的原位实验 原位测试的近似成像分辨率,按样品厚度和透明度分类。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/image-resolution-in-situ.jpg/_jcr_content/renditions/original.image_file.100.75.0,0,1363,1023.file/image-resolution-in-situ.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/image-resolution-in-situ.jpg/_jcr_content/renditions/original.image_file.360.270.0,0,1363,1023.file/image-resolution-in-situ.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/image-resolution-in-situ.jpg/_jcr_content/renditions/original.image_file.768.576.0,0,1363,1023.file/image-resolution-in-situ.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/image-resolution-in-situ.jpg/_jcr_content/renditions/original.image_file.1024.768.0,0,1363,1023.file/image-resolution-in-situ.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/image-resolution-in-situ.jpg/_jcr_content/renditions/original.image_file.1280.960.0,0,1363,1023.file/image-resolution-in-situ.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/image-resolution-in-situ.jpg/_jcr_content/renditions/original.image_file.1363.1022.0,0,1363,1023.file/image-resolution-in-situ.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/image-resolution-in-situ.jpg/_jcr_content/renditions/original.image_file.1363.1022.0,0,1363,1023.file/image-resolution-in-situ.jpg"})
![纳米级的原位实验 原位测试的近似成像分辨率,按样品厚度和透明度分类。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/image-resolution-in-situ.jpg/_jcr_content/renditions/original.image_file.100.75.file/image-resolution-in-situ.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/image-resolution-in-situ.jpg/_jcr_content/renditions/original.image_file.360.270.file/image-resolution-in-situ.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/image-resolution-in-situ.jpg/_jcr_content/renditions/original.image_file.768.576.file/image-resolution-in-situ.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/image-resolution-in-situ.jpg/_jcr_content/renditions/original.image_file.1024.768.file/image-resolution-in-situ.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/image-resolution-in-situ.jpg/_jcr_content/renditions/original.image_file.1280.960.file/image-resolution-in-situ.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/image-resolution-in-situ.jpg/_jcr_content/renditions/original./image-resolution-in-situ.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/image-resolution-in-situ.jpg/_jcr_content/renditions/original./image-resolution-in-situ.jpg"})
原位测试的近似成像分辨率,按样品厚度和透明度分类。蔡司Xradia Ultra填补了SEM/TEM的纳米级图像分辨率(仅限于表面成像或极薄样品)和微米级断层扫描之间的空白。
原位测试的近似成像分辨率,按样品厚度和透明度分类。蔡司Xradia Ultra填补了SEM/TEM的纳米级图像分辨率(仅限于表面成像或极薄样品)和微米级断层扫描之间的空白。
纳米级的原位实验
填补原位测试的空白
材料研究旨在探究在非自然环境条件或外部刺激下出现的特性。如果您的目标是观察微观结构的变化并将其与材料的性能相联系,那么原位测试方法就是您的理想之选。对这些变化进行现场成像,并对能代表整体特性的样品量进行研究,也同样重要。
Xradia Ultra尤其适用于纳米级的原位实验和成像:它可以让您在实验室里对样品量可代表整体特性的三维结构进行无损成像,并且拥有纳米级的图像分辨率。
![Xradia Ultra原位力学加载台 Xradia Ultra原位力学加载台]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia_ultra_load_stage.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/xradia_ultra_load_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia_ultra_load_stage.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/xradia_ultra_load_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia_ultra_load_stage.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/xradia_ultra_load_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia_ultra_load_stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/xradia_ultra_load_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia_ultra_load_stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/xradia_ultra_load_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia_ultra_load_stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/xradia_ultra_load_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia_ultra_load_stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/xradia_ultra_load_stage.jpg"})
在样品的原生环境下对其进行原位观察
了解形变事件和失效与局部纳米级特征的关系。通过补充现有的力学测试方法,您可以深入了解跨多个长度尺度的性能。蔡司Xradia Ultra原位力学加载台利用无损三维成像技术,以特殊的方式实现了压缩、拉伸、压痕等原位纳米力学测试。这使得您能够以高达50 nm的图像分辨率,研究样品内部结构在载荷状态下的三维演变。
![蔡司Xradia Ultra的Norcada加热台和偏压台 蔡司Xradia Ultra的Norcada加热台和偏压台]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia_ultra_norcada_heating_stage.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/xradia_ultra_norcada_heating_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia_ultra_norcada_heating_stage.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/xradia_ultra_norcada_heating_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia_ultra_norcada_heating_stage.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/xradia_ultra_norcada_heating_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia_ultra_norcada_heating_stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/xradia_ultra_norcada_heating_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia_ultra_norcada_heating_stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/xradia_ultra_norcada_heating_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia_ultra_norcada_heating_stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/xradia_ultra_norcada_heating_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia_ultra_norcada_heating_stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/xradia_ultra_norcada_heating_stage.jpg"})
进行原位加热实验
在高温下研究降解过程、热膨胀和相变等纳米级的材料变化。蔡司Xradia Ultra的Norcada加热台使您能够对高温样品进行纳米级的无损三维成像。MEMS加热器技术可在空气中将样品加热至500℃,其灵活的设计使得用同样的部件即可进行样品加热或电压偏置。
![Crossbeam LaserFIB Crossbeam LaserFIB]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_crossbeam-laserfib.jpg/_jcr_content/renditions/original.image_file.100.100.248,0,1308,1060.file/accessories_crossbeam-laserfib.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_crossbeam-laserfib.jpg/_jcr_content/renditions/original.image_file.360.360.248,0,1308,1060.file/accessories_crossbeam-laserfib.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_crossbeam-laserfib.jpg/_jcr_content/renditions/original.image_file.768.768.248,0,1308,1060.file/accessories_crossbeam-laserfib.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_crossbeam-laserfib.jpg/_jcr_content/renditions/original.image_file.1024.1024.248,0,1308,1060.file/accessories_crossbeam-laserfib.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_crossbeam-laserfib.jpg/_jcr_content/renditions/original.image_file.1060.1060.248,0,1308,1060.file/accessories_crossbeam-laserfib.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_crossbeam-laserfib.jpg/_jcr_content/renditions/original.image_file.1060.1060.248,0,1308,1060.file/accessories_crossbeam-laserfib.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_crossbeam-laserfib.jpg/_jcr_content/renditions/original.image_file.1060.1060.248,0,1308,1060.file/accessories_crossbeam-laserfib.jpg"})
![Crossbeam LaserFIB Crossbeam LaserFIB]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_crossbeam-laserfib.jpg/_jcr_content/renditions/original.image_file.100.68.file/accessories_crossbeam-laserfib.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_crossbeam-laserfib.jpg/_jcr_content/renditions/original.image_file.360.245.file/accessories_crossbeam-laserfib.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_crossbeam-laserfib.jpg/_jcr_content/renditions/original.image_file.768.524.file/accessories_crossbeam-laserfib.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_crossbeam-laserfib.jpg/_jcr_content/renditions/original.image_file.1024.698.file/accessories_crossbeam-laserfib.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_crossbeam-laserfib.jpg/_jcr_content/renditions/original.image_file.1280.873.file/accessories_crossbeam-laserfib.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_crossbeam-laserfib.jpg/_jcr_content/renditions/original.image_file.1440.982.file/accessories_crossbeam-laserfib.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_crossbeam-laserfib.jpg/_jcr_content/renditions/original./accessories_crossbeam-laserfib.jpg"})
尽享LaserFIB提供的快捷样品制备优势
即使感兴趣区域(ROI)深埋在样品内部,您也能够迅速对其进行定位,同时轻松制备用于使用蔡司Xradia Ultra或同步辐射测试的柱状样品。使用将蔡司Crossbeam FIB-SEM与超短脉冲飞秒激光相结合的LaserFIB,您可以实现跨越多尺度的关联工作流。例如,您可以使用先前获得的三维X射线显微镜数据集找到感兴趣区域,并用Cut-to-ROI工作流对其进行进一步分析。使用飞秒激光切割毫米级的材料并制备样品,用Xradia Ultra进行分析,然后再利用FIB-SEM的功能进行纳米和微米级的切割、断层扫描、成像和高级分析。
![Dragonfly Pro 固体氧化物燃料电池,使用Xradia Ultra成像。样品提供者:美国科罗拉多矿业大学。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg/_jcr_content/renditions/original.image_file.100.100.480,29,1499,1048.file/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg/_jcr_content/renditions/original.image_file.360.360.480,29,1499,1048.file/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg/_jcr_content/renditions/original.image_file.768.768.480,29,1499,1048.file/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg/_jcr_content/renditions/original.image_file.1019.1019.480,29,1499,1048.file/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg/_jcr_content/renditions/original.image_file.1019.1019.480,29,1499,1048.file/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg/_jcr_content/renditions/original.image_file.1019.1019.480,29,1499,1048.file/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg/_jcr_content/renditions/original.image_file.1019.1019.480,29,1499,1048.file/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg"})
![Dragonfly Pro 样品提供者:美国科罗拉多矿业大学。 固体氧化物燃料电池,使用Xradia Ultra成像。样品提供者:美国科罗拉多矿业大学。 样品提供者:美国科罗拉多矿业大学。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg/_jcr_content/renditions/original.image_file.100.55.file/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg/_jcr_content/renditions/original.image_file.360.197.file/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg/_jcr_content/renditions/original.image_file.768.420.file/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg/_jcr_content/renditions/original.image_file.1024.560.file/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg/_jcr_content/renditions/original.image_file.1280.700.file/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg/_jcr_content/renditions/original.image_file.1440.788.file/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg/_jcr_content/renditions/original./accessories_xradia_ultra_ors_dragonfly_interface-ultra.jpg"})
固体氧化物燃料电池,使用Xradia Ultra成像。
可视化和分析软件:蔡司推荐Dragonfly Pro
这是一款用于高级分析和可视化处理的软件解决方案,适用于通过各种技术(包括X射线、FIB-SEM和SEM)采集的3D数据。ORS Dragonfly Pro仅由蔡司提供,为可视化和分析大型3D灰度数据提供了一个直观、完整、可量身定制的工具包。您可用Dragonfly Pro对三维数据进行导航、注释以及创建包括视频在内的媒体文件,还可执行图像处理、图像分割和对象分析来量化结果。
![蔡司的Scout-and-Scan™控制系统 Xradia Ultra的定位和扫描(Scout-and-Scan)图形用户界面,沙界面马赛克]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg/_jcr_content/renditions/original.image_file.100.100.358,34,1880,1556.file/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg/_jcr_content/renditions/original.image_file.360.360.358,34,1880,1556.file/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg/_jcr_content/renditions/original.image_file.768.768.358,34,1880,1556.file/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg/_jcr_content/renditions/original.image_file.1024.1024.358,34,1880,1556.file/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg/_jcr_content/renditions/original.image_file.1280.1280.358,34,1880,1556.file/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg/_jcr_content/renditions/original.image_file.1440.1440.358,34,1880,1556.file/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg/_jcr_content/renditions/original.image_file.1522.1522.358,34,1880,1556.file/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg"})
![蔡司的Scout-and-Scan™控制系统 Xradia Ultra的定位和扫描(Scout-and-Scan)图形用户界面,沙界面马赛克]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg/_jcr_content/renditions/original.image_file.100.61.file/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg/_jcr_content/renditions/original.image_file.360.219.file/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg/_jcr_content/renditions/original.image_file.768.468.file/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg/_jcr_content/renditions/original.image_file.1024.624.file/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg/_jcr_content/renditions/original.image_file.1280.780.file/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg/_jcr_content/renditions/original.image_file.1440.878.file/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg/_jcr_content/renditions/original.image_file.1920.1170.file/xradiaultra-scout-a-scan-gui-sands_interface_mosaic.jpg"})
设置、加载、定位、扫描、运行。非常简单方便。图形用户界面可以引导您轻松创建工作流。
使用操作便捷的软件创建高效的工作流
您可以利用创新的蔡司Scout-and-Scan™控制系统来简化样品和扫描设置,提高您的生产力。 基于工作流的用户界面将指导您轻松完成对准样品、定位感兴趣区域和设置三维扫描的步骤。您可以对同一样品进行多次扫描,以此对不同的感兴趣区域进行成像,或结合使用不同的成像模式。对那些有广泛实验需求的中心实验室用户来说,这款简单易用的系统是理想之选。高级用户能够完全操控显微镜,完成自定义成像任务,或使用集成的Python API将显微镜整合至原位实验中。