ThinProcess® Family In-line monitoring spectrometer system

ZEISS ThinProcess® P  is a single or multichannel measurement system that determines the optical properties following one or multiple coating steps. The discrete substrates are automatically identified and the gaps are used for automatic triggering and referencing. The measurement can be performed in vacuum or atmosphere.

✔  Measurements of the spectral transmittance and reflectance from 360 nm to 1050 nm
✔  Calculations and analyses of color, coating thickness, spectra evaluation, absorbance / absorptance, solar characteristics and more
✔  Extended wavelength range up to 1650 nm
✔  Sheet resistance measurements

ZEISS ThinProcess® Q is a traversing measuring system that determines the optical and spectroscopic properties of the finished product. The system provides you with multiple automatic scan modes for measuring predefined positions on the final product.

✔ Measurements of the spectral transmittance and reflectance from 360 nm to 1050 nm
✔ Calculations and analyses of color, coating thickness, spectra evaluation, absorbance / absorptance, solar characteristics and more
✔ Extended wavelength range up to 1650 or 2150 nm
✔ Color measurements with an observation angle of 55°

ZEISS ThinProcess®  R  is a single or multichannel measurement system which determines the optical properties following one or multiple coating steps.
The system can be controlled by digital I/O or fieldbus signals to activate the measurement and the referencing.
Thus it is ideal if gaps between panes are too small or the process speed is too high for automatic detection.
The measurement can be performed in vacuum or atmosphere.

✔  Measurements of the spectral transmittance and reflectance from 360 nm to 1050 nm
✔  Calculations and analyses of color, coating thickness, spectra evaluation, absorbance / absorptance, solar characteristics and more
✔  Extended wavelength range from 365 nm to 1650 nm or 2150 nm
✔  Sheet resistance measurements

ZEISS ThinProcess®  WEB  is a single or multichannel measurement system that determines the optical properties following one or multiple coating steps in coil coating plants. The measurement regime can be completely integrated into the automation strategy of the machine. The measurement can be performed in vacuum or atmosphere.

✔  Measurements of the spectral transmittance and reflectance from 360 nm to 1050 nm
✔  Calculations and analyses of color, coating thickness, spectra evaluation, absorbance / absorptance, solar characteristics and more
✔ Extended wavelength range from 340 nm to 1,650 nm or from 365 nm to 2150 nm
✔  Sheet resistance measurements